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Resonance Raman spectroscopy in Si and C ion-implanted double-wall carbon nanotubes

机译:si和C离子注入双壁碳纳米管的共振拉曼光谱

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摘要

The effect of 170 keV Si and 100 keV C ion bombardment on the structure and properties of highly pure, double-wall carbon nanotubes has been investigated using resonance Raman spectroscopy. The implantations were performed at room temperature with ion doses ranging between 1×1013  ions/cm2 and 1×1015 ions/cm2. As expected, the Si irradiation created more disorder than the C irradiation for the same ion fluence. For both species, as the ion-implantation fluence increased, the D-band intensity increased, while the G-band intensity decreased, indicating increased lattice disorder, in analogous form to other forms of graphite and other nanotube types. The frequency of the G band decreased with increasing dose, reflecting a softening of the phonon mode due to lattice defects. With increasing ion fluence, the radial breathing modes (RBMs) of the outer tubes (either semiconducting or metallic) disappeared before the respective RBM bands from the inner tubes, suggesting that the outer nanotubes are more affected than the inner nanotubes by the ion irradiation. After Si ion bombardment to a dose of 1×1015  ions/cm2, the Raman spectrum resembled that of highly disordered graphite, indicating that the lattice structures of the inner and outer nanotubes were almost completely destroyed. However, laser annealing partially restored the crystalline structure of the nanotubes, as evidenced by the re-emergence of the G and RBM bands and the significant attenuation of the D band in the Raman spectrum.
机译:使用共振拉曼光谱研究了170 keV Si和100 keV C离子轰击对高纯度双壁碳纳米管的结构和性能的影响。离子注入在室温下进行,离子剂量范围为1×1013离子/ cm2至1×1015离子/ cm2。不出所料,对于相同的离子通量,Si辐射比C辐射产生更多的无序。对于这两种物质,随着离子注入通量的增加,D谱带强度增加,而G谱带强度下降,表明晶格紊乱增加,类似于石墨和其他纳米管类型的其他形式。 G带的频率随着剂量的增加而降低,这反映了由于晶格缺陷导致的声子模的软化。随着离子通量的增加,外管(半导体或金属)的径向呼吸模式(RBM)在来自内管的相应RBM谱带消失之前消失,这表明外纳米管比内纳米管受离子辐照的影响更大。 Si离子轰击至1×1015 5离子/ cm2的剂量后,拉曼光谱类似于高度无序的石墨,表明内部和外部纳米管的晶格结构几乎被完全破坏。然而,激光退火部分地恢复了纳米管的晶体结构,如拉曼光谱中G和RBM谱带的重新出现以及D谱带的明显衰减所证明的。

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